instruments

The W.M. Keck Electron Microscopy Facility has been established since 2001 through generous grants from the W.M. Keck foundation, NSF, and funds from the University of Delaware community. This facility contributes to scientific capabilities by enabling students, faculty, and other researchers in the College of Engineering and other units of the University to use state-of-the-art equipment in research and education.

The facility is located in 022 Spencer Laboratory on campus. Currently it houses a field-emission gun transmission electron microscope JEM-2010F FasTEM, a conventional LaB6 transmission electron microscope JEM-2000FX, a Tecnai G2 12 Twin transmission electron microscope, and two scanning electron microscopes: JSM-7400F and JXA-840.

The JEM-2010F FasTEM provides 1.9A point resolution or 1.0A lattice resolution. A few peripheral attachments further enhance its analytical capabilities, including the scanning transmission electron microscopy (STEM) for both bright field imaging (STEM-BF) and high angle annular dark field (STEM-HAADF) imaging, electron energy loss spectroscopy (EELS) and energy filtered imaging, and X-ray energy dispersive spectroscopy (XEDS). In addition, this instrument allows remote access and remote control through internet connection.

The JEOL-2000FX is a general purpose TEM and teaching instrument. It has a point resolution of 2.9A and is equipped with STEM and XEDS capibilities as well.

In addition to conventional imaging and diffraction, the Tecnai G2 12 Twin TEM is facilitated with cryo-TEM and low dose imaging capibililties.

The JSM-7400F field emission scanning electron microscpe has a 1nm resolution at 15kV and a 1.5nm resolution at 1kV. It allows operation in a wide range of beam energies from 100eV to 30keV, and affords various operation modes including secondary electron imaging (SEI), Back scattered electron imaging, gentle beam mode, and imaging with energy filters. An ultra-thin window XEDS detector detects elements with Z>4 and offers a 130eV spectral resolution. This SEM also allows remote control via internet.

The facility has over 12 different TEM sample holders including routine single and double tilt holders, analytical holders, liquid nitrogen cryoholders and cryotransfer holders, a double tilt liquid helium holder, and a double tilt heating holder allowing studies at temperatures from 20 K to 1270 K. In addition, we have a variety of sample preparation equipment, including dimple devices, ion mills, a sputter coater, a carbon coater, and a low speed diamond saw.

The Electron Microscopy Facility facilitates researches in the field of physical sciences and biomatereials for the College of Engineering at the University of Delaware and for other units on the campus on a fee schedule. The laboratory staff and associated faculty are knowledgeable in scanning electron microscopy, transmission electron microscopy, and their applications in a wide range of materials research. We are glad to work with users on campus or other organizations in many areas of electron microscopy applications, training, or consultation.

Instruments		(Click above buttons to find out equipment specifications)

The W.M. Keck Electron Microscopy Facility has been established since 2001 through generous grants from the W.M. Keck foundation, NSF, and funds from the University of Delaware community. This facility contributes to scientific capabilities by enabling students, faculty, and other researchers in the College of Engineering and other units of the University to use state-of-the-art equipment in research and education. The facility is located in 022 Spencer Laboratory on campus. Currently it houses a field-emission gun transmission electron microscope JEM-2010F FasTEM, a conventional LaB6 transmission electron microscope JEM-2000FX, a Tecnai G2 12 Twin transmission electron microscope, and two scanning electron microscopes: JSM-7400F and JXA-840. The JEM-2010F FasTEM provides 1.9A point resolution or 1.0A lattice resolution. A few peripheral attachments further enhance its analytical capabilities, including the scanning transmission electron microscopy (STEM) for both bright field imaging (STEM-BF) and high angle annular dark field (STEM-HAADF) imaging, electron energy loss spectroscopy (EELS) and energy filtered imaging, and X-ray energy dispersive spectroscopy (XEDS). In addition, this instrument allows remote access and remote control through internet connection. The JEOL-2000FX is a general purpose TEM and teaching instrument. It has a point resolution of 2.9A and is equipped with STEM and XEDS capibilities as well. In addition to conventional imaging and diffraction, the Tecnai G2 12 Twin TEM is facilitated with cryo-TEM and low dose imaging capibililties. The JSM-7400F field emission scanning electron microscpe has a 1nm resolution at 15kV and a 1.5nm resolution at 1kV. It allows operation in a wide range of beam energies from 100eV to 30keV, and affords various operation modes including secondary electron imaging (SEI), Back scattered electron imaging, gentle beam mode, and imaging with energy filters. An ultra-thin window XEDS detector detects elements with Z>4 and offers a 130eV spectral resolution. This SEM also allows remote control via internet. The facility has over 12 different TEM sample holders including routine single and double tilt holders, analytical holders, liquid nitrogen cryoholders and cryotransfer holders, a double tilt liquid helium holder, and a double tilt heating holder allowing studies at temperatures from 20 K to 1270 K. In addition, we have a variety of sample preparation equipment, including dimple devices, ion mills, a sputter coater, a carbon coater, and a low speed diamond saw. The Electron Microscopy Facility facilitates researches in the field of physical sciences and biomatereials for the College of Engineering at the University of Delaware and for other units on the campus on a fee schedule. The laboratory staff and associated faculty are knowledgeable in scanning electron microscopy, transmission electron microscopy, and their applications in a wide range of materials research. We are glad to work with users on campus or other organizations in many areas of electron microscopy applications, training, or consultation.