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JEM-2010F    
     
     
Resolution 0.10nm Lattice
0.19nm Point
Accelerating Voltage 80 to 200kV
Magnification 50x to 1,500,000x
STEM Capibility STEM BF and HAADF
GIF, EELS, and
Digital Imaging
Energy filtered imaging; Analysis of light elements; Multiple scan CCD
FasTEM Remote image transmission and remote operation
     
JEM-2010f FasTEM high resolution analytical transmission electron microscope
Applications: XEDS, EELS, Imaging Filter, SAED, CBED, STEM, HAADF STEM, HREM, Diffraction Contrast Imaging
Accelerating Voltage: Up to 200 kV (50 V steps)
Filament: Zirconated Tungsten (100) thermal field emission tip
Resolution: CTEM 0.10 nm lattice / 0.19 nm point-to-point
STEM 0.16 nm HAADF (high angle annular dark field)
XEDS System: Horizontal Ultra-thin Window Si-Li X-ray detector (active area = 30 mm^2) capable of detecting elements with Z >4.
EDAX detector with EDAX acquisition software
EELS System: Gatan Imaging Filter (GIF) for electron energy loss spectroscopy and imaging.
Image Acquisition & Analysis System: Gatan 794 cooled multi-scan CCD TV camera for high resolution imaging
Gatan 692 Retractable TV rate CCD TV camera.
Sample Holders: JEOL Single-Tilt holder
JEOL Double-Tilt Analytical holder
Gatan 636 Double-Tilt Liquid-Nitrogen Cryo-holder
Gatan Single-Tilt Liquid-Nitrogen Cryo-transfer Holder
Other Accessories: Free lens control, fully independent control of all lenses.
FasTEM remote Windows 2000 server based control system.


     
JEM-2010F JEM-2000FX Tecnai G2 12 JSM-7400F JXA-840